Accurate by eliminating scanner crosstalkXY scan

Independent closed loopXY and Z flexible scanners

orthogonalXY scan

Accurate measurement of sample surface morphology information without software processing

Comprehensive and professional atomic force microscope solution

Covering multiple scanning modes of scanning probe microscopes

More intelligentNX electronic controller defaults to advanced nanomechanical measurement mode

Featuring industry-leading compatibility and upgradability

Humanized design of software and hardware functions

Open use for convenient sample or needle exchange

Pre aligned probe clamp design, easy and intuitive to performSLD optical calibration

Park SmrtScanTM-Atomic force microscope operating software can help first-time users and professional users enter Conduct professional nanoscale research.

nothingThe coupling relationshipXY and Z scanners

Park's core technology lies in its proprietary scanner architecture. The flexible structure designed based on independent XY and Z scanners allows you to easily obtain high-precision nanoscale resolution data.

Industry leading low noiseZ detector

Park AFM is equipped with a low-noise Z-detector with a noise level below 0.02 nm, achieving precise imaging of sample morphology without edge overshoot or calibration. The Park NX series not only provides you with high-precision data, but also greatly saves you time and costs.

Due to low noiseZ-detector measures accurate sample morphology

Utilize low noiseZ-detector signal for morphology imaging

There is high broadband,The low noise of the Z detector is only 0.02 nm

There is no front or back edge overshoot phenomenon at the edge position

Only need to calibrate once at the original factory

sample: 1.2 μ m standard step height
(9 μm x 1 μm, 2048 pixels x 128 lines)

Park NX7 parameters

Scanner

Z scanner

Flexible guided high thrust scanner
Z-scan range:15 μ m (30 μ m optional)

XY scanner

Closed loop control single module flexibleXY scanner
Scanning range:50 µm × 50 µm
(Optional 10 μ m × 10 μ m or 100 μ m × 100 μ m)

Displacement table

Z displacement table

Z displacement table travel range: 26 mm

XY displacement table

XY displacement table travel range: 13 mm X 13 mm

Sample rack

sample size : up to 50 mm
Sample thickness:up to 20 mm

Software

SmartScan

AFM system control and data acquisition software
Quick setting and easy imaging of intelligent mode
Advanced use of manual mode and more precise scanning control

SmartAnalysis

AFM data analysis software
Independent design- Can install and analyze data other than AFM
Capable of generating and collecting data3D drawing